Title: Introduction to Single Event Upset
Speaker: Dr. Shi-Jie Wen (Distinguished Engineer, Cisco Systems Inc., San Jose, CA)
Host: Associate Prof. Jiang Jiang
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Part |
Time |
Location |
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Lecture I |
2 pm-4:45pm (Afternoon), May 9th, Wednesday; |
Room 104, School of Microelectronics |
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Lecture II |
6 pm-8:45pm (Evening), May 9th, Wednesday; |
Room 104, School of Microelectronics |
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Lecture III |
2 pm-4:45pm (Afternoon), May 10th, Thursday. |
Room 104, School of Microelectronics
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Abstract:
This class will give the audience a full understanding SEU basics, such as its fundamental physics, complexity, its impact to component and system. The class will also provide the detail of the different testing techniques, facilities, test methodology and how to quantify the SEU by performing different testing. Finally, the class will reach its ultimate goal that is how to mitigate the SEU impact at component and system level and what are the challenges ahead of us.
Audience should be able to use this class to deal with daily SEU work in the commercial, consumer and enterprise markets.
Bio of Dr. Shi-Jie Wen
Shi-Jie Wen received his Ph.D in Material Engineering from University of Bordeaux I in 1992. He joined Cisco Systems Inc., San Jose, CA in 2004, where he has been engaged in Si process and IC component technology, reliability, qualification and quality assurance. His main interests are in SEU, WLR, complex failure analysis, etc. Before Cisco, he worked in Cypress Semiconductor where he was involved in the area of product reliability and qualification with technology in 0.35u, 0.25u, 0.18u, 0.13u and 90nm. He has been authoring or co-authoring more than 100 papers in journals or conference.