Title: Test Compression and Soft Errors
Speaker: Dr L-T Wang
Chairman, Founder, President and CEO, Syntest Tech. Inc
When: 9:00-12:00, May 27, 2010
Where: Room 104
Presenter Bio:
Laung-Terng (L.-T.) Wang, chairman and chief executive officer (CEO) of SynTest Technologies (Sunnyvale, CA), is also a visiting professor in the Department of Electrical Engineering at National Taiwan University. He received his BSEE and MSEE degrees from National Taiwan University in 1975 and 1977, respectively, and his MSEE and EE Ph.D. degrees under the Honors Cooperative Program (HCP) from Stanford University in 1982 and 1987, respectively. He worked at Intel (Santa Clara, CA) and Daisy Systems (Mountain View, CA) from 1980 to 1986 and was with the Department of Electrical Engineering of Stanford University as Research Associate and Lecturer from 1987 to 1991.
Encouraged by his advisor and professor Edward J. McCluskey, a member of the National Academy of Engineering, Dr. Wang founded SynTest Technologies in 1990. The design-for-testability (DFT) technologies Dr. Wang has developed have been successfully implemented in thousands of ASIC designs worldwide. He currently holds 21 U.S. Patents, 15 European Patents, and one China Patent in the areas of scan synthesis, test generation, at-speed scan testing, test compression, logic built-in self-test (BIST), and design for debug-and-diagnosis (DFD). Dr. Wang spearheaded efforts to raise over $2 million endowed funds to honor his undergraduate advisor and NTU chair professor Irving T. Ho (Stanford Ph.D., 1962; see http://www.irvinghofoundation.org/), and his graduate advisor and Stanford professor Edward J. McCluskey (MIT ScD, 1956; see http://dodge.stanford.edu/ejmf/). Since
2003, he has helped establish a number of chair professorships, graduate fellowships, and undergraduate scholarships at Stanford University, National Taiwan University, Tsinghua University, and Shanghai Jiao Tong University. He has also co-authored and co-edited three internationally used DFT/EDA textbooks – VLSI Test Principles and Architectures (2006), System-on-Chip Test Architectures (2007), and Electronic Design Automation (2009) – with sales over 5,000 copies. A member of Sigma Xi, Dr. Wang received a 2007 Meritorious Service Award from the IEEE Computer Society and is a co-recipient of the 2008 IEICE Information and Systems Society Excellent Paper Award for an excellent series of papers that appeared in IEICE Transactions on Information and Systems during a period of five years. He is a Fellow of the IEEE and a Golden Core Member of the IEEE Computer Society.