Date: 2009-6-12 Time: 10:30–11:30am, June 16, 2009 Room: Room 401 of the building of school of microelectronics; Title: Variational Analysis of Full-Chip Leakage Power in Nanometer VLSI Systems Speaker: Dr. Sheldon X-.D. Tan Organizer: Prof. Guoyong Shi Abstract The chip performance uncertainties coming from the variability inherent in silicon manufacture process are emerging as the